Our infrastructure

Our infrastructure

The Resonant Nanophotonics group develops state of the art methods in nanoscopy, fluorescence microscopy and single molecule microscopy, scatterometry, near-field manipulation and nanofabrication. A non-exhaustive list of our set ups:

  • Supercontinuum scatterometry (NKT SuperK Extreme, any wavelength from 450 to 2000 nm), transmission, reflection and dark field [42], [47]

  • Back-focal plane or `Fourier’ microscopy: mapping of single nano-antenna radiation patterns and differential scattering cross sections with sub-degree resolution, over large angular ranges (NA=1.4) from visible to NIR. [42], [65], [74]

  • Single-molecule microscopy, including spectroscopy, time-correlated single photon counting for fluorescence lifetime and g(2)-antibunching, and fluorescence correlation spectroscopy, applicable to room-temperature emitters in the visible [58], [62], [81], [78]

  • Montana cryostat for low-temperature (down to 3K) single emitter microscopy

  • Scanning near-field microscopy with homebuilt tuning-fork shear-force feedback, synchronized with single emitter spectroscopy [44]

  • Fourier-space fluorescence microscopy to study plasmon lasers. Integrated with spatial-light modulation (SLM) to control amplitude and phase profiles of pump beams [69], [77], [77]

  • Twin-OPA system (LightConversion Orpheus F) delivering down to 30 fs pulses from 650 to 900 nm, and from 1100 to 2000 nm, feeding into ultrafast pulse interferometry, and designed for pump-probe microscopy experiments

  • Narrowband cw spectroscopy near 780 nm for interrogating high Q cavity systems, integrated with a set up to measure through integrated waveguides, approached tapered fibers, or through near- and far-field addressing in a microscope

  • We make heavy use of the AMOLF NanoLab Amsterdamcleanroom operated by AMOLF for top-down sample fab by e-beam lithography and focused ion beam milling.


[81] F. T. Rabouw, M. Kamp, R. J. A. van Dijk-Moes, D. R. Gamelin, A. F. Koenderink, A. Meijerink, and D. Vanmaekelbergh, Delayed Exciton Emission and Its Relation to Blinking in CdSe Quantum Dots, Nano Lett. 15, 7718–7725, (2015). (p)reprint DOI
[78] F. T. Rabouw, R. Vaxenburg, A. A. Bakulin, R. J. A. van Dijk-Moes, H. J. Bakker, A. Rodina, E. Lifshitz, A. L. Efros, A. F. Koenderink, and D. Vanmaekelbergh, Dynamics of Intraband and Interband Auger Processes in Colloidal Core-Shell Quantum Dots, ACS Nano 9, 10366–10376, (2015). (p)reprint DOI
[77] A. H. Schokker and A. F. Koenderink, Statistics of Randomized Plasmonic Lattice Lasers, ACS Photonics 2, 1289–1297, (2015). (p)reprint DOI
[74] C. I. Osorio, A. Mohtashami, and A. F. Koenderink, K-Space Polarimetry of Bullseye Plasmon Antennas, Sci. Rep. 5, 9966, (2015). (p)reprint DOI
[69] A. H. Schokker and A. F. Koenderink, Lasing at the Band Edges of Plasmonic Lattices, Phys. Rev. B 90, 155452, (2014). (p)reprint DOI
[65] A. Kwadrin and A. F. Koenderink, Diffractive Stacks of Metamaterial Lattices with a Complex Unit Cell: Self-Consistent Long-Range Bianisotropic Interactions in Experiment And Theory, Phys. Rev. B 89, 045120, (2014). (p)reprint DOI
[62] F. T. Rabouw, P. Lunnemann, R. J. A. van Dijk-Moes, M. Frimmer, F. Pietra, A. F. Koenderink, and D. Vanmaekelbergh, Reduced Auger Recombination in Single CdSe/CdS Nanorods By One-Dimensional Electron Delocalization, Nano Lett. 13, 4884–4892, (2013). (p)reprint DOI
[58] A. Mohtashami and A. F. Koenderink, Suitability of Nanodiamond Nitrogen-Vacancy Centers for Spontaneous Emission Control Experiments, New. J. Phys. 15, 043017, (2013). (p)reprint DOI
[47] I. Sersic, M. A. van de Haar, F. B. Arango, and A. F. Koenderink, Ubiquity of Optical Activity in Planar Metamaterial Scatterers, Phys. Rev. Lett. 108, 223903, (2012). (p)reprint DOI
[44] M. Frimmer, Y. Chen, and A. F. Koenderink, Scanning Emitter Lifetime Imaging Microscopy for Spontaneous Emission Control, Phys. Rev. Lett. 107, 123602, (2011). (p)reprint DOI
[42] I. Sersic, C. Tuambilangana, and A. F. Koenderink, Fourier Microscopy of Single Plasmonic Scatterers, New. J. Phys. 13, 083019, (2011). (p)reprint DOI